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RL78/G1A CHAPTER 22 SAFETY FUNCTIONS
22.3.8.1 A/D test register (ADTES)
<R>
This register is used to select the A/D converter’s positive reference voltage, A/D converter’s negative reference
voltage, analog input channel (ANIxx), temperature sensor output voltage, or internal reference voltage (1.45 V) as the
target of A/D conversion.
When using the A/D test function, specify the following settings:
• Select negative reference voltage as the target of A/D conversion for zero-scale measurement.
• Select positive reference voltage as the target of A/D conversion for full-scale measurement.
The ADTES register can be set by an 8-bit memory manipulation instruction.
Reset signal generation clears this register to 00H.
Figure 22-16. Format of A/D Test Register (ADTES)
Address: F0013H After reset: 00H R/W
Symbol 7 6 5 4 3 2 1 0
ADTES 0 0 0 0 0 0 ADTES1 ADTES0
ADTES1 ADTES0 A/D conversion target
0 0
ANIxx/temperature sensor output voltage
Note
/internal reference voltage (1.45 V)
Note
(This is
specified using the analog input channel specification register (ADS).)
1 0 Negative reference voltage (selected with the ADREFM bit in ADM2)
1 1 Positive reference voltage (selected with the ADREFP1 or ADREFP0 bit in ADM2)
Other than above Setting prohibited
Note Temperature sensor output voltage and internal reference voltage (1.45 V)
can be used only in HS
(high-speed main) mode.
22.3.8.2 Analog input channel specification register (ADS)
This register specifies the input channel of the analog voltage to be A/D converted.
Set A/D test register (ADTES) to 00H when measuring the ANIxx/temperature sensor output voltage/internal reference
voltage (1.45 V).
The ADS register can be set by a 1-bit or 8-bit memory manipulation instruction.
Reset signal generation clears this register to 00H.
R01UH0305EJ0200 Rev.2.00 788
Jul 04, 2013