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RL78/G1A CHAPTER 11 A/D CONVERTER
R01UH0305EJ0200 Rev.2.00 367
Jul 04, 2013
11.3.10 A/D test register (ADTES)
This register is used to select the + side reference voltage or − side reference voltage for the A/D converter, an analog
input channel (ANIxx), the temperature sensor output voltage, or the internal reference voltage (1.45 V) as the target for
A/D conversion. When using as the A/D test function, set as follows.
• For zero-scale measurement, select the − side reference voltage as the target for conversion.
• For full-scale measurement, select the + side reference voltage as the target for conversion.
The ADTES register can be set by an 8-bit memory manipulation instruction.
Reset signal generation clears this register to 00H.
Figure 11-14. Format of A/D Test Register (ADTES)
Address: F0013H After reset: 00H R/W
Symbol 7 6 5 4 3 2 1 0
ADTES 0 0 0 0 0 0 ADTES1 ADTES0
ADTES1 ADTES0 A/D conversion target
0 0
ANIxx/temperature sensor output voltage
Note
/internal reference voltage (1.45 V)
Not
e
(This is specified using the analog input channel specification register (ADS).)
1 0 − side reference voltage (Setting at ADREFM bit of ADM2 register)
1 1 + side reference voltage (Setting at ADREFP1, ADREFP0 bits of ADM2 register)
Other than above Setting prohibited
Note Temperature sensor output/internal reference voltage (1.45 V) can be used only in HS (high-speed
main) mode. For detail, see Figure 24-3 Format of User Option Byte (000C2H/010C2H).
Caution For details of the A/D test function, see CHAPTER 22 SAFETY FUNCTIONS.
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